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Measuring Systems
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All FISCHERSCOPE® XRF measuring systems perform precise measurement results, even without calibration, due to the integrated fundamental parameter method. If the traceability of measurement ... Read More
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Feritscope Machine
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Handheld instrument for the measurement of the ferrite content Fast, non-destructive measurement of ferrite content on-site or in the lab Measurement range 0.1 to 80% Fe or 0.1 to 110 FN Ferrite ... Read More
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Beta Scope
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Measuring module for Benchtop unit MMS-PC2 for coating thickness measurement, comparing different materials acc. to the beta backscattering method, especially for the measurement of thin, organic ... Read More
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Picodentor Machine
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Next generation of high precision user-friendly instrumented indentation instrument to measure nanomechanical properties such as hardness, elastic modulus, creep and much more of coatings and ... Read More
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Sealing Quality Tester
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Sealing quality tester of anodic coatings on aluminum The hand-held sealing quality tester measures the admittance (Y) of anodic oxide films according DIN EN ISO 12373-5 and ASTM 457-67. Measuring ... Read More
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Sample Securing Devices
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roper positioning of specimens is a daily challenge inlab operations. The new securing devices for the hardness measurement systems PICODENTOR® HM 500and FISCHERSCOPE® HM 2000 are important ... Read More
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Couloscope Thickness Gauge
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Couloscope Thickness Gauge
Benchtop unit for coulometric coating thickness measurement of virtually all metallic coatings on metallic or nonmetallic substrates; of individual layers or multi-layers
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Coating thickness device
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Coating thickness device
Coating thickness standards, e.g. foilsFerrite standardsConductivity standardsmany of them with factory calibration certificate, (on request)
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Thickness Measurement Instrument
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Thickness Measurement Instrument
Enhanced handheld gauges for nondestructive coating thickness measurement on virtually all metals
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Material Analyser
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Material Analyser
FISCHER provides a comprehensive range of specific XRF instruments for coating thickness measurement and material analysis on printed circuit boards (PCB) and wafers.
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Handheld Gauge
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Handheld Gauge
Handheld gauge for nondestructive coating thickness measurement of duplex layers (Lacquer/Zinc) on steel or iron
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Handheld Gauge
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Handheld Gauge
Handheld gauge for nondestructive coating thickness measurement of electrically conductive coatings on many substrates, also on small structures and rough surfaces
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Sigmascope Device
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Sigmascope Device
Handheld instrument for conductivity measurement of non-ferromagnetic metals
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Copper Layers
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Copper Layers
Handheld instrument for measuring copper layers on PCBs, non-destructive, fast, accurate, and without influence from opposing copper layers
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Ischerscope Machine
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Ischerscope Machine
High performance X-ray fluorescence (XRF) measuring system with a programmable XY-stage and Z-axis for automated measurements of very thin coatings and for trace analysis
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Thickness Gauge
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Thickness Gauge
Pocket gauges with connected cable probe and PC-interface for a convenient, fast and nondestructive coating thickness measurement on virtually all metals
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Portable Holiday Detectors
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Portable Holiday Detectors
Portable holiday detectors – also known as pore test instruments – with continuously adjustable test voltage. Robust instruments for harsh use on construction sites or in manufacturing.
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Benchtop Unit
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Benchtop Unit
Premium Benchtop unit for universal coating thickness measurement and material testing, with color touchscreen, individual configuration and various interfaces
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Premium Handheld Gauges
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Premium Handheld Gauges
Premium handheld coating thickness gauges with color touchscreen for non-destructive coating thickness measurement on virtually all metals
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Precision Gauges
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Precision Gauges
Ultra compact pocket gauges for simple, fast and nondestructive coating thickness measurement on virtually all metals or only on steel/iron
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