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12367 Crosthwaite Circle
Poway, California-92064, United States+(1)-858-8488000
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Multi-Functional Top and Bottom Vision Inspection System

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Key Features

  • Both IC top and bottom inspections
  • Die μ-crack detection down to 2 μm
  • High throughput BGA inspection
  • Optical mask for PGA bent pin inspection
  • Online / Inline / Offline image processing for speed, accuracy and efficiency
  • Group recipes for combining multiple vision inspections together
  • Standalone system with laptop driven controls

Capabilities

  • IC top side inspections:
    • Die inspection with μ-crack detection
    • Edge chip, foreign material and stains inspections
    • Substrate inspection
  • IC bottom side inspections:
    • BGA ball damage inspection
    • PGA bent pin inspection
    • LGA contamination
  • Auto-ID
    • 1D bar code
    • 2D data matrix

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