Member
Since
2
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Jeol Limited
Shin-Suzuharu, Building No. 3f, 2-8-3, Akebono-Cho, Tachikawa
Tokyo, Tokyo-1900012, Japan
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Scanning Electron Microscope

The JSM-6701F is a field emission scanning electron microscope (FESEM) incorporating a cold cathode field emission gun, ultra high vacuum, and sophisticated digital technologies for high resolution high quality imaging of micro structures. Featuring a conical FE gun and a semi-in-lens objective lens, the system is capable of high resolution imaging as well as high quality real time image display at all scan speeds, enabling observation and recording of superior images even in a bright room. The JSM-6701F is able to handle samples up to 8 inches in diameter.

The JSM-6701F is a super intelligent PC SEM assuring compatibility with future computer technologies. Its unique graphical user interface controls condition setup, motor stage drive, imaging, and data filing, assuring stable and reliable operation. Using Window® XP with superior networking as a host computer, the system facilitates the process from imaging to data processing under optimum conditions, allowing the operator to display real time images, save the data in an external PC through the network, retrieve and manipulate the data.

Scanning Electron Microscope

The JSM-7001F, Thermal Field Emission SEM, is the ideal platform for demanding analytical applications as well as those requiring high resolution and ease-of-use. The JSM-7001F has a large, 5-axis, fully eucentric, motorized, automated specimen stage, a one-action specimen exchange airlock, small probe diameter even at large probe current and low voltage, and expandability with ideal geometry for EDS, WDS, EBSP, and CL. The specimen chamber handles specimens up to 200mm in diameter.

A new Windows® XP based computer interface allows for unprecedented ease of operation including function buttons that switch operation modes quickly and easily. Up to four live images can be simultaneously viewed, including signal mixing, and a single scan can record and store all four images at once.

The JSM-7001F SEM also supports full integration of EDS, WDS, e-beam lithography, and an image database. Stage automation is standard with a 5-axis computer control of X, Y, Z Tilt and eucentric rotation.

Scanning Electron Microscope

The JSM-7600F is a stateof- the-art thermal FE-SEM that successfully combines ultrahighresolution imaging with optimized analytical functionality. In addition, the JSM-7600F incorporates a large specimen chamber. This uniquely designed chamber, which accommodates a 200 mm diameter specimen, is optimized for a large variety of detectors for secondary electrons, backscattered electrons, EDS, WDS, EBSD, CL, etc.
Features
Ultrahigh resolution comparable to the cold cathode FE-SEM.
In-Lens Thermal FEG.
Aperture angle control lens automatically optimizes the spot size at both high and low currents for both analysis and imaging.
High probe current up to 200 nA (at 15 kV) for various analytical purposes (WDS, EDS, EBSD, CL, etc.)
Built-in r-filter enabling user selectable mixture of secondary electron and backscattered electron images.
Gentle Beam mode for top-surface imaging, reduced beam damage and charge suppression.
Eco design for energy conservation.

Scanning Electron Microscope

The JSM-6610 is a high-performance scanning electron microscope for fast characterization and imaging of fine structures on both small and large samples. One of a family of four SEM models that are widely-used in all research fields and industrial applications, the JSM-6610 enables observation of specimens up to 200mm in diameter.Throughout the evolution of this popular SEM family, JEOL has continued to enhance features and capabilities to offer the best possible imaging resolution, versatility, and operator interface.With a high resolution of 3.0nm at 30kV, the JSM-6610 delivers amazing clarity of the finest structures. In addition to routine imaging at several hundreds of times greater resolution than the optical microscope, and with a focal depth several tens of times greater than the optical microscope, the SEM allows for detailed measurements, including 3D measurement from stereo images. Dual live image display of the secondary electron image and a backscattered composition image allow the user to contrast and compare specific details. An optional energy dispersive X-ray spectrometer (EDS) provides elemental analysis.

Scanning Electron Microscope

The JSM-6510 is a high-performance, low cost, scanning electron microscope for fast characterization and imaging of fine structures. One of a family of four SEM models that are widely-used in all research fields and industrial applications, the JSM-6510 enables observation of specimens up to 150mm in diameter.

Throughout the evolution of this popular SEM family, JEOL has continued to enhance features and capabilities to offer the best possible imaging resolution, versatility, and operator interface.

With a high resolution of 3.0nm at 30kV, the JSM-6510 delivers amazing clarity of the finest structures. In addition to routine imaging at several hundreds of times greater resolution than the optical microscope, and with a focal depth several tens of times greater than the optical microscope, the SEM allows for detailed measurements, including 3D measurement from stereo images. Dual live image display of the secondary electron image and a backscattered composition image allow the user to contrast and compare specific details. An optional energy dispersive X-ray spectrometer (EDS) provides elemental analysis.

Scanning Electron Microscope

ClairScope™ consists of an atmospheric scanning electron microscope (ASEM) and an optical microscope positioned on top. The ASEM is isolated from the SEM with a thin film installed at the top end of the inverted SEM. The thin film, designed to transmit an electron beam while blocking air, separates the sample in atmosphere from the vacuum in the SEM. The electron beam is projected from below to the sample placed on the thin film for high resolution imaging of the sample in atmosphere. The same area of view of the sample can also be imaged in the optical microscope on top. The thin film is configured in a dish (thin film dish), which can be used for cell culture in a culture chamber.

Scanning Electron Microscope

The JSM-7500F is an analytical Field Emission SEM featuring enhanced performance, ease of operation, and energy efficiency. The JSM-7500F offers the highest resolution at the lowest kV of any SEM available, achieving a resolution of 1.4 nm at 1 kV. The JSM-7500F provides in-lens performance (1.0nm at 15kV) but can handle samples up to 200mm in diameter x 10mm height.

The JSM-7500F is highly resistant to floor vibration and acoustic noise and is well suited for difficult installation requirements. The entirely new user interface is designed to facilitate operation for those inexperienced in FE SEM, and the new Economy Mode (stand-by with scheduling) can save from 25% to 55% in energy consumption.

The JSM-7500F, with its extreme imaging capabilities, is a superior instrument for use in the fields of nanotechnology, materials science and biology.

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