Welcome to HelloTrade!
I Want to Buy
Request for Quote
Member
Since
4 Yrs
Shin-Suzuharu, Building No. 3f, 2-8-3, Akebono-Cho, Tachikawa
Tokyo, Tokyo-1900012, Japan+(81)-42-5483381
Contact Supplier

Scanning Electron Microscope

Next Product »
Yes! I am interested
FOB Price : Get Price

ClairScope™ consists of an atmospheric scanning electron microscope (ASEM) and an optical microscope positioned on top. The ASEM is isolated from the SEM with a thin film installed at the top end of the inverted SEM. The thin film, designed to transmit an electron beam while blocking air, separates the sample in atmosphere from the vacuum in the SEM. The electron beam is projected from below to the sample placed on the thin film for high resolution imaging of the sample in atmosphere. The same area of view of the sample can also be imaged in the optical microscope on top. The thin film is configured in a dish (thin film dish), which can be used for cell culture in a culture chamber.

Scanning Electron Microscope

Scanning Electron Microscope

Get Quotes
Yes! I am interested
FOB Price : Get Price

The JSM-6701F is a field emission scanning electron microscope (FESEM) incorporating a cold cathode field emission gun, ultra high vacuum, and sophisticated digital technologies for high resolution high quality imaging of micro structures. Featuring a conical FE gun and a semi-in-lens objective lens, the system is capable of high resolution imaging as well as high quality real time image display at all scan speeds, enabling observation and recording of superior images even in a bright room. The JSM-6701F is able to handle samples up to 8 inches in diameter.

The JSM-6701F is a super intelligent PC SEM assuring compatibility with future computer technologies. Its unique graphical user interface controls condition setup, motor stage drive, imaging, and data filing, assuring stable and reliable operation. Using Window® XP with superior networking as a host computer, the system facilitates the process from imaging to data processing under optimum conditions, allowing the operator to display real time images, save the data in an external PC through the network, retrieve and manipulate the data.

Scanning Electron Microscope

Scanning Electron Microscope

Get Quotes
Yes! I am interested
FOB Price : Get Price

The JSM-7500F is an analytical Field Emission SEM featuring enhanced performance, ease of operation, and energy efficiency. The JSM-7500F offers the highest resolution at the lowest kV of any SEM available, achieving a resolution of 1.4 nm at 1 kV. The JSM-7500F provides in-lens performance (1.0nm at 15kV) but can handle samples up to 200mm in diameter x 10mm height.

The JSM-7500F is highly resistant to floor vibration and acoustic noise and is well suited for difficult installation requirements. The entirely new user interface is designed to facilitate operation for those inexperienced in FE SEM, and the new Economy Mode (stand-by with scheduling) can save from 25% to 55% in energy consumption.

The JSM-7500F, with its extreme imaging capabilities, is a superior instrument for use in the fields of nanotechnology, materials science and biology.

RELATED PRODUCTS
 

 
sending enquiry ....

unable to instantiate your call right now. please try after some time.

close

©Copyright HelloTrade.com