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Scanning Electron Microscope

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The JSM-6610 is a high-performance scanning electron microscope for fast characterization and imaging of fine structures on both small and large samples. One of a family of four SEM models that are widely-used in all research fields and industrial applications, the JSM-6610 enables observation of specimens up to 200mm in diameter.Throughout the evolution of this popular SEM family, JEOL has continued to enhance features and capabilities to offer the best possible imaging resolution, versatility, and operator interface.With a high resolution of 3.0nm at 30kV, the JSM-6610 delivers amazing clarity of the finest structures. In addition to routine imaging at several hundreds of times greater resolution than the optical microscope, and with a focal depth several tens of times greater than the optical microscope, the SEM allows for detailed measurements, including 3D measurement from stereo images. Dual live image display of the secondary electron image and a backscattered composition image allow the user to contrast and compare specific details. An optional energy dispersive X-ray spectrometer (EDS) provides elemental analysis.

Scanning Electron Microscope

Scanning Electron Microscope

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The JSM-7600F is a stateof- the-art thermal FE-SEM that successfully combines ultrahighresolution imaging with optimized analytical functionality. In addition, the JSM-7600F incorporates a large specimen chamber. This uniquely designed chamber, which accommodates a 200 mm diameter specimen, is optimized for a large variety of detectors for secondary electrons, backscattered electrons, EDS, WDS, EBSD, CL, etc.
Features
Ultrahigh resolution comparable to the cold cathode FE-SEM.
In-Lens Thermal FEG.
Aperture angle control lens automatically optimizes the spot size at both high and low currents for both analysis and imaging.
High probe current up to 200 nA (at 15 kV) for various analytical purposes (WDS, EDS, EBSD, CL, etc.)
Built-in r-filter enabling user selectable mixture of secondary electron and backscattered electron images.
Gentle Beam mode for top-surface imaging, reduced beam damage and charge suppression.
Eco design for energy conservation.

Scanning Electron Microscope

Scanning Electron Microscope

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ClairScope™ consists of an atmospheric scanning electron microscope (ASEM) and an optical microscope positioned on top. The ASEM is isolated from the SEM with a thin film installed at the top end of the inverted SEM. The thin film, designed to transmit an electron beam while blocking air, separates the sample in atmosphere from the vacuum in the SEM. The electron beam is projected from below to the sample placed on the thin film for high resolution imaging of the sample in atmosphere. The same area of view of the sample can also be imaged in the optical microscope on top. The thin film is configured in a dish (thin film dish), which can be used for cell culture in a culture chamber.


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