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Surfcom 130a

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The Surface Roughness Tester offered by us measures surface texture of metal and non-metal parts. The small and compact size makes it easily transportable. The artificial intelligence functions automatically select the ideal cut off value, measuring range and other conditions. It is user friendly and supports wide range of styli options.
Salient features:

  • Top Flight Performance in Production
  • Best of class Straightness Accuracy 0.3um/50 mm
  • Easy Change of Stylish
  • Wide Range of styli options
  • 50 mm traverse length, built in datum plane and large measuring range detector
  • Selectable Amplifier LCD touch panel
  • Handy, compact use
  • Analysis parameters catering to worldwide requirements
  • Artificial Intelligence functions automatically select the ideal cut off value, measuring range and other conditions. This automates measurement.
  • Host of Analysis Functions- incorporates 34 types of roughness and 32 waviness parameters.
  • Tilt Correction Function: Six type of automatic tilt correction are provided.
  • Evaluation Range Setting- The waveform on the screen is enclosed by two cursors, allowing the desired range to be set and the parameters to be calculated.
  • PC Card Slot- Measuring Conditions, Measured result management or measured data can be output in binary and text format.

Measuring Range: X Axis- 50mm
Z axis - 800µ mm (Measuring range resolution: 800µm/10nm, 80µm/1nm, 8 µm/0.1nm)
Straightness accuracy: 0.3µm/50mm
Analysis items:
Standards: Complies with JIS-2001, JIS-1994, JIS-19822, ISO- 1997, ISO-1984, DIN-1990, ASME-1995, and CNOMO.
Parameters: Ra, Rq, Ry, Rp, Rv, Rc, Rz, Rmax, Rt, Rz,J, R3z, Sm, S, R ?a, R ?q, R ?a, R ?q, TILT A, Ir, Pc, Rsk, Rkpk, Rvk, Mr1, Mr2, VO, K, tp, Rmr, Tp2, Rmr2, R dc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx, AR, NR, CPM, SR, SAR
Evaluation curves: Section profile curve, filtered waviness curve, filtered center line waviness curve, rolling circle waviness curve, rolling circle center line waviness curve, DIN4776 special curve, roughness motif curve, envelope waviness curve
Surface Characteristics graphs: Bearing area, curve, amplitude distribution (ADF) curve, power graph
TILT Correction: Linear correction, first half correction, latter half correction, both end correction, spline curve correction
Magnification : Vertical (Z-axis)- 50-100K Auto, Horizontal (X-axis): 1-5K auto
Detector : Tip radius 2µm, material diamond
Special functions: Artificial Intelligence functions, step analysis, PC card
Standard Accessories: Standard specimen, Recording Paper, Touch Pen, Instruction Manual


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